Inmetro / Scientific and Industrial Metrology / Materials Metrology Division
The use of techniques like optical (Raman, FTIR and UV-Vis) and x-ray fluorescence spectroscopy as well as x-ray diffraction for the investigation of matter represent an important tool for the characterization of the physical-chemical properties of several materials systems. Analysis of optical, vibrational and electronic properties, the identification of crystalline structures and chemical composition, in addition to measurements of microstructural properties (residual stress, crystallographic texture and crystallite size) are good examples of this capability.
- Spectroscopic measurements of vibrational and eletronic properties of solid, liquid and gás samples using different laser exitation lines: 457 nm, 488 nm, 514 nm, 633 nm and 785 nm;
- Operation modes: triple subtractive (reaching regions close to the laser line), triple additive and direct single spectrometer with notch filters.
- Optical absorption measurements of solid, liquid or paste samples in the range from 175 to 3300 nm.
- Diffuse reflectance measurements.
Infrared spectroscopy (FT-IR)
- High performance FT-IR absorption measurements of solid, liquid or powder samples in the range from 30 to 15800 cm-1.
X-ray Diffraction (XRD)
- X-ray diffraction measurements with high resolution, using a set of special accessories: X-ray tubes with different targets, primary Gobel mirror, Sol-X detector, Eulerian cradle and others;
- Structural and microstructural analysis of crystalline materials, grazing incidence analysis and reflectometry of thin films, measurements of crystallographic texture and residual stresses.
- Chemical analysis of bulk materials with a high sensibility, being able to perform trace element analysis and quantification.
- Structural and microstructural analysis of several materials systems (drugs, clays, metallic alloys, oxides, etc);
- Characterization of new materials like: graphenes e nanotubes;
- Biofuels chemical analysis;
- Development of methodology for measurement of crystallite size;
- Development of methodology for measurement of residual stresses by x-ray diffraction.