This conference is devoted to the presentation of technical and scientific contributions, as well as invited papers from metrology institutes around the world.
The Program includes:
• Parallel exhibition of equipment and services related to the metrology;
• Invited lectures;
• plenary speakers;
• SIM Working Group meeting.
Plenary speakers:
a) Dr. Hector Laiz – National Institute of Industrial Technology (INTI/Argentina)
b) Dr. Yi-hua Tang - National Institute of Standards and Technology (NIST/EUA)
c) Dr. António Manuel da Cruz Serra - Technical university of Lisbon and President of IMEKO
d) Dr. Alexandre BOUNOUH - Central Laboratory of Electrical Industries (LCIE) and Paris XI University.
e) Dr. Smail TEDJINI - Grenoble Institute of Technology. President and founder of the IEEECPMT French
Chapter, Vice-President of IEEE Section France, Vice-Chair of URSI Commission.
f) Dr. Chantal Gunther: ENSICAEN, France