Program

This conference is devoted to the presentation of technical and scientific contributions, as well as invited papers from  metrology institutes around the world.

The final program will be defined after the deadline for submission of full papers.

The conference is devoted to the presentation of technical and scientific papers, as well as invited papers from metrology institutes in the world.

 

• Parallel exhibition of equipment and services related to the metrology;
  
  
• Invited lectures;
  
  
• plenary speakers;
  
  
• SIM Working Group meeting.