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 Inter-American Metrology System - SIM
 
 
 

PROGRAM


 

Themes:
The workshop focus on dimensionality measurements (length, diameter, chirality, surface area), nanotube sample
characterization and the state-of-the-art achievements on the related techniques (Electronic Microscopy, Scanning Probe Microscopy, Thermal Analisis, Spectroscopy, Transport Measurements and new techniques).

 

Invited Speakers:

 

 


Schedule:
 
8:00
Departure from Hotel Rio Copa
9:00

Registration

9:20 - 9:30 Opening 
9:30 - 10:00 Invited 1  Pasha Nikolaev
10:00 - 10:30 Invited 2  John Lehman
10:30 - 11:30 Poster + Coffee Break
11:30 - 12:00

Invited 3   Dominique Hubert

12:00 - 12:30 Invited 4   Hua Jiang
12:30 - 13:00 Invited 5   Mauricio Terrones
13:00 - 14:30 Lunch
14:30 - 15:00 Invited 6   Yu-Ming Lin
15:00 - 15:30 Invited 7   Abdou Hassanien
15:30 - 15:50 Invited 8   Mikhail E. Itkis
15:50 - 16:10 Invited 9   Cristiano Fantini
16:10 - 16:30 Invited 10 Achim Hartschuh
16:30 - 17:00 Coffee Break
17:00 - 18:00 Round table
18:00 - 18:10 Concluding remarks
18:30 Departure